Zhang Houngjian, Ye Xi, LiJun. RESEARCH ON MAIN PROCESSING PARAMETERS OF BAMBOO-BASED WAFERBOARD[J]. Journal of Southwest Forestry University, 1995, 15(4): 56-60. DOI: 10.11929/j.issn.2095-1914.1995.04.009
Citation: Zhang Houngjian, Ye Xi, LiJun. RESEARCH ON MAIN PROCESSING PARAMETERS OF BAMBOO-BASED WAFERBOARD[J]. Journal of Southwest Forestry University, 1995, 15(4): 56-60. DOI: 10.11929/j.issn.2095-1914.1995.04.009

RESEARCH ON MAIN PROCESSING PARAMETERS OF BAMBOO-BASED WAFERBOARD

  • Based on the outcomes from the pre-experiments,the glued structure of randomlymatted wafers and the general procedures with a series of related parameters,such keyprocessing parameters as the thickness of the wafer,glue content and temperature duringhot-pressing are optimized in this study to support the reliable basic technology theory forindustrial production of bamboo-based waferboard.Results from the comprehensiveorthogonal experiment show that bamboo-based waferboard with equal quality to woodyones can be made under proper technological conditions.
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